BS EN 726-3-1996 识别卡系统.电信.集成电路卡和终端.应用独立卡要求.

作者:标准资料网 时间:2024-05-19 03:19:17   浏览:8832   来源:标准资料网
下载地址: 点击此处下载
【英文标准名称】:Identificationcardsystems-Telecommunications-Integratedcircuit(s)cardsandterminals-Applicationindependentcardrequirements
【原文标准名称】:识别卡系统.电信.集成电路卡和终端.应用独立卡要求.
【标准号】:BSEN726-3-1996
【标准状态】:现行
【国别】:英国
【发布日期】:1996-01-15
【实施或试行日期】:1996-01-15
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:电信;识别证;识别卡;识别方法;磁性卡片;合格;集成电路;卡片;机读资料;编码(数据转换);粗梳机;验证
【英文主题词】:Cards;Characteristics;Chips;Compatibility;Definition;Definitions;Functions;ICcards;Identitycards;Informationprocessing;Informationtransfer;Integratedcircuits;Machinereadable;Magneticcards;Models;Modules;Physicalproperties;Printed-circuitcards;Properties;Safetydevices;Safetyfunction;Safetyrequirements;Signaltransmission;Signals;Specification(approval);Symbols;Telecommunication;Telecommunications;Terminaldevices;Terminals;Transmissionprotocol
【摘要】:ThispartofEN726specifiestheapplication-independentcharacteristicsofmulti-applicationIC-cardsandplug-inmodulesfortelecommunicationapplicationsinordertoensureinteroperabilityfortelecommunicationcardswiththevarioussystemsandterminals.Mono-applicationcardsareconsideredtobeasubsetofmulti-applicationcards.Allcommoncharacteristics,necessaryfortheinteractionsbetweenthecardandtheexternalworldaredefined.ThispartofEN726doesnotprecludecardsfromothersectorsfromcontainingtelecommunicationapplication(s)basedonthispartofEN726.Theapplication-specificcharacteristicsarenotdefinedinthispartofEN726.Theyaredefinedanddescribedintherelevantapplicationrequirements.ThispartofEN726doesnotspecifyanyinternaltechnicalimplementation.Itdescribes:-therequirementsforthephysicalcharacteristicsofthecard,theelectronicsignalsandthetransmissionprotocols;-theapplication-independentlogicalmodelwhichshouldbeusedasabasisforthedesignofthelogicalstructureof,optionally,severalapplicationsinthecard;-thesecurityfacilitiesconcerningtheaccesstothedifferentpartswithinthecardandthepossibleinteractionsbetweentheseparts.Alsothedescriptionofsecurityfunctionswhichshouldbeneededgenerallybythevariousapplications.Theyshouldbeavailableasacommonset;-thedescriptionoftheapplication-independentfunctionsbetweencardandexternalworld,shouldbeusedasastandardizedcommonsetforallbasicfunctionsusedininternationalapplications;-themappingoftheseapplicationmessages(commandsandresponses)understandardizedprotocols;-thecontentsofthemasterFile;-theinteroperabilityofICcards;-theoverallsecurityaspectsforcard-manufacturers,applicationprovidersandcard-issuers.
【中国标准分类号】:A13
【国际标准分类号】:35_240_15
【页数】:84P.;A4
【正文语种】:英语


下载地址: 点击此处下载
【英文标准名称】:DOCSIS1.0OperationsSupportSystemInterface
【原文标准名称】:DOCSIS1.0操作支持系统接口
【标准号】:ANSI/SCTE22-3-2002
【标准状态】:作废
【国别】:美国
【发布日期】:2002
【实施或试行日期】:
【发布单位】:美国国家标准学会(US-ANSI)
【起草单位】:SCTE
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Informationtechnology;Interfaces;Supports
【摘要】:ThisdocumentoutlinestheManagementInformationBases(MIBs)forhigh-speeddata-over-cablesystemsdevelopedbytheDOCSISDataOverCableServicesworkinggroup.
【中国标准分类号】:L23;L65
【国际标准分类号】:35_200
【页数】:
【正文语种】:英语


【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Neutronirradiation
【原文标准名称】:半导体器件.机械和气候试验方法.中子辐照
【标准号】:BSEN60749-17-2003
【标准状态】:现行
【国别】:英国
【发布日期】:2003-06-19
【实施或试行日期】:2003-06-19
【发布单位】:英国标准学会(BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:气候试验;电气工程;破坏试验;试验;半导体;集成电路;中子射线;气候;辐射效应;环境试验;半导体器件;电学测量;电子工程;机械试验;电子设备及元件;元部件
【英文主题词】:
【摘要】:Theneutronirradiationtestisperformedtodeterminethesusceptibilityofsemiconductordevicestodegradationintheneutronenvironment.Thetestsdescribedhereinareapplicabletointegratedcircuitsanddiscretesemiconductordevices.Thistestisintendedformilitary-andspace-relatedapplications.Itisadestructivetest.Theobjectivesofthetestareasfollows:a)todetectandmeasurethedegradationofcriticalsemiconductordeviceparametersasafunctionofneutronfluence,andb)todetermineifspecifiedsemiconductordeviceparametersarewithinspecifiedlimitsafterexposuretoaspecifiedlevelofneutronfluence(seeClause4).
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:10P;A4
【正文语种】:英语